특수 논리 IC는 BCD 속도 곱셈, 주소 지정 가능한 스캔 포트, 버스 종단 배열, CML 드라이버, 비교기, ABT 스캔 테스트, 이진 전가산기, 상보 쌍 플러스 인버터, 구성 가능한 버퍼, 접점 바운스와 같은 애플리케이션별 논리 출력 유형을 제공하도록 설계되었습니다. 제거기, 수정 발진기, 지연 요소, 차동 수신기, LVTTL-GTLP 트랜시버, 메모리 디코더, 전력 양호 감지기 및 주파수 분배기.
| 부분 # | 제조업체 | 설명 | 유효성 | 가격 | 수량 |
|---|---|---|---|---|---|
74AS632FNSpecialty Logic ICs | Rochester Electronics | 32 BIT PARALLEL ERROR DETECTION/ | 66 | - | |
AM2960/BZASpecialty Logic ICs | Advanced Micro Lites | 8760201ZA) | 재고 | - | |
74AUP1Z125GF,132Specialty Logic ICs | NXP Semiconductors | BUS DRIVER, AUP/ULP/V SERIES, 1 | 99398 | - | |
54LS183/BCASpecialty Logic ICs | Rochester Electronics | DUAL MARKED (5962-9054101CA) | 750 | - | |
SN54S182JSpecialty Logic ICs | Texas Instruments | Look-Ahead Carry Generators 16-CDIP -55 to 125 | 7101 | - | |
SNJ54BCT8240AFKSpecialty Logic ICs | Texas Instruments | Scan Test Devices With Octal Buffers 28-LCCC -55 to 125 | 재고 | - | |
JM38510/07802BEASpecialty Logic ICs | Texas Instruments | Look-Ahead Carry Generators 16-CDIP -55 to 125 | 재고 | - | |
7604301EASpecialty Logic ICs | Texas Instruments | Binary Full Adder Single-Element 4-Bit 16-Pin CDIP Tube | 재고 | - | |
CD54HC297F3ASpecialty Logic ICs | Texas Instruments | High Speed CMOS Logic Digital Phase-Locked-Loop 16-CDIP -55 to 125 | 재고 | - | |
SNJ54BCT8374AJTSpecialty Logic ICs | Texas Instruments | Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 24-CDIP -55 to 125 | 재고 | - | |
SNJ54ABT8652JTSpecialty Logic ICs | Texas Instruments | Scan Test Devices With Octal Bus Transceivers And Registers 28-CDIP -55 to 125 | 재고 | - | |
SNJ54S182FKSpecialty Logic ICs | Texas Instruments | Arithmetic Logic Unit 4-Bit 1-Element Bipolar 20-Pin CLLCC Tube | 재고 | - | |
M38510/07802BEASpecialty Logic ICs | Texas Instruments | Arithmetic Logic Unit 4-Bit 1-Element Bipolar 16-Pin CDIP Tube | 재고 | - | |
JM38510/34201B2ASpecialty Logic ICs | Texas Instruments | Binary Full Adder Single 4-Bit 20-Pin LCCC Tube | 재고 | - | |
M38510/31202BEASpecialty Logic ICs | Texas Instruments | Binary Full Adder Single-Element 4-Bit 16-Pin CDIP Tube | 재고 | - | |
CD54ACT283F3ASpecialty Logic ICs | Texas Instruments | Binary Full Adder Single-Element 4-Bit 16-Pin CDIP Tube | 재고 | - | |
SNJ54BCT8245AFKSpecialty Logic ICs | Texas Instruments | Scan Test Devices With Octal Bus Transceivers 28-LCCC -55 to 125 | 재고 | - | |
SNJ54F283FKSpecialty Logic ICs | Texas Instruments | 4-Bit Binary Full Adders With Fast Carry 20-LCCC -55 to 125 | 재고 | - | |
SNJ54BCT8244AJTSpecialty Logic ICs | Texas Instruments | Scan Test Devices With Octal Buffers 24-CDIP -55 to 125 | 373 | - | |
SNJ54BCT8374AFKSpecialty Logic ICs | Texas Instruments | Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125 | 1015 | - | |
JM38510/34201BFASpecialty Logic ICs | Texas Instruments | Binary Full Adder Single 4-Bit 16-Pin CFPAK Tube | 9203 | - | |
SNJ54ABT8646FKSpecialty Logic ICs | Texas Instruments | Scan Test Devices With Octal Bus Transceivers And Registers 28-LCCC -55 to 125 | 재고 | - | |
SNJ54BCT8245AJTSpecialty Logic ICs | Texas Instruments | Scan Test Devices With Octal Bus Transceivers 24-CDIP -55 to 125 | 5 | - | |
M38510/07801BJASpecialty Logic ICs | Texas Instruments | Arithmetic Logic Unit 4-Bit 1-Element Bipolar 24-Pin CDIP Tube | 재고 | - | |
SNJ54ABT8543FKSpecialty Logic ICs | Texas Instruments | Scan Test Devices With Octal Registered Bus Tranceivers 28-LCCC -55 to 125 | 재고 | - |