오실로스코프 프로브 케이블 어셈블리는 신호 테스트 및 측정을 위해 오실로스코프와 전자 회로 사이에 전기적 연결을 제공하는 데 사용됩니다. 프로브 유형에는 능동 차동, 능동-단일 종단, 복조기, 차동, 필터 프로브-저역 통과, 범용, 모듈식 수동, 2차 점화 픽업, 트리거 프로브 및 감쇠 값 범위가 1:1~1인 전압 프로브가 있습니다. 1000:1.
| 부분 # | 제조업체 | 설명 | 유효성 | 가격 | 수량 |
|---|---|---|---|---|---|
PICOSCOPE 4444 1000 V C&VOscilloscope Probes | Pico Technology | Test Probes PS4444 1000 V CAT III mains current & voltage measurement ki | 재고 | - | |
A3000 PROBE GROUND BLADE PACKOscilloscope Probes | Pico Technology | Test Probes A3000 probe ground blade (pack of 2 sizes, 2 of each) | 재고 | - | |
A3076 750MHZ ACTIVE PROBEOscilloscope Probes | Pico Technology | Test Probes A3076 750Mhz single ended active probe kit for PS6000E | 재고 | - | |
TA301 2000A CURRENT PROBE D9Oscilloscope Probes | Pico Technology | Test Probes Current probe 200/2000 A AC/DC D9 connector | 2 | - | |
3570-PROscilloscope Probes | Fluke Electronics | Test Probes CT CABLE, 10 FT AEMC TO PR INTERFACE | 재고 | - | |
N2840AOscilloscope Probes | Keysight | Test Probes Passive probe - 50 MHz 10:1 | 3 | - | |
FI1000-E2K-TIPOscilloscope Probes | Fluke Networks | Test Probes E2000 BULKHEAD VIDEO PROBE TIP | 재고 | - | |
TPSFLEX18-TF-IIOscilloscope Probes | Fluke Electronics | Test Probes | 재고 | - | |
801515Oscilloscope Probes | Extech Instruments | Test Probes Probe, Temperature, J General Purpose | 재고 | - | |
TIVP1Oscilloscope Probes | Tektronix | Test Probes 1 GHz galvanically isolated high impedance differential probe with standard accessory kit | 재고 | - | |
PPM203BOscilloscope Probes | Tektronix | Test Probes ARTICULATING ARM; WITH XYZ MANIPULATOR AND HIGH-MASS BASE | 재고 | - | |
TCP305AOscilloscope Probes | Tektronix | Test Probes Probe, AC/DC Current; 50Amp DC, DC-50MHZ, Certificate of Traceable Calibration Standard | 8 | - | |
FI1000-EXND-LC-TIPOscilloscope Probes | Fluke Networks | Test Probes EXTENDED LC BULKHEAD VIDEO PROBE TIP | 1 | - | |
PCBITE-7014Oscilloscope Probes | Sensepeek | Test Probes 3x Dual ground spring needle 3,5mm | 재고 | - | |
TIVP1LOscilloscope Probes | Tektronix | Test Probes 1 GHz, long cable option galvanically isolated high impedance differential probe with standard accessory kit | 재고 | - | |
N2787AOscilloscope Probes | Keysight | Test Probes Probe positioner- 3D | 57 | - | |
XR-PB1-292FOscilloscope Probes | Quantic X-Microwave | Test Probes 2.92mm Probe (for use on X-MW Prototyping Plate) | 재고 | - | |
TP750Oscilloscope Probes | Tektronix | Test Probes 100 Ohm RTD Temperature Probe | 재고 | - | |
9T002MTC36Oscilloscope Probes | Advanced Energy | Test Probes Temperature Probe, Type T, Wire, MTC Connector, 36" | 20 | - | |
IS9J113MTC48Oscilloscope Probes | Advanced Energy | Test Probes Temperature Probe, Intrinsically Safe, Type J, T-handle, Immersion (Tapered), 48" | 재고 | - | |
N2859AOscilloscope Probes | Keysight | Test Probes Replaceable probe tip | 16 | - | |
IS9T606MTC06Oscilloscope Probes | Advanced Energy | Test Probes Temperature Probe, Intrinsic Safe, Type T, Air/Gas, 6" | 재고 | - | |
11028767-00Oscilloscope Probes | TE Connectivity Measurement Specialties | Test Probes 21232P10 PROBE | 재고 | - | |
PICOCONNECT 926Oscilloscope Probes | Pico Technology | Test Probes PicoConnect 926 5:1 DC coupled digital | 재고 | - | |
850185Oscilloscope Probes | Extech Instruments | Test Probes Probe, Temperature, RTD General Purpose, Oyster | 재고 | - |