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오실로스코프 프로브
(1038 결과)오실로스코프 프로브 케이블 어셈블리는 신호 테스트 및 측정을 위해 오실로스코프와 전자 회로 사이에 전기적 연결을 제공하는 데 사용됩니다. 프로브 유형에는 능동 차동, 능동-단일 종단, 복조기, 차동, 필터 프로브-저역 통과, 범용, 모듈식 수동, 2차 점화 픽업, 트리거 프로브 및 감쇠 값 범위가 1:1~1인 전압 프로브가 있습니다. 1000:1.
| 부분 # | 제조업체 | 설명 | 유효성 | 가격 | 수량 |
|---|---|---|---|---|---|
 XM-PB1-292FOscilloscope Probes | Quantic X-Microwave | Test Probes 2.92mm Probe (for use on X-MW Prototyping Plate) | 4 | - | |
 BKP/1750-5Oscilloscope Probes | Advanced Energy | Test Probes Big Kelvin Probe, 1750 Connector | 1 | - | |
 I17XX-FLEX6000/3Oscilloscope Probes | Fluke Electronics | Test Probes Fluke-17XX iFlex 6000A 12 IN 3PK | 재고 | - | |
 850188Oscilloscope Probes | Extech Instruments | Test Probes Probe, Temperature, Thermistor, For 407228 | 재고 | - | |
 E2308AOscilloscope Probes | Keysight | Test Probes Therm Temp Probe -40 - +150 degrees | 13 | - | |
 TA068 RIGID TIPSOscilloscope Probes | Pico Technology | Test Probes Pack of 5 Rigid 0.5mm probe tips for 2.5 mm probes | 재고 | - | |
 CT3687NISTCALOscilloscope Probes | Cal Test Electronics | Test Probes CT3687 plus NIST Calibration w/out Data | 재고 | - | |
 IS9K613MTC06Oscilloscope Probes | Advanced Energy | Test Probes Temperature Probe, Intrinsic Safe, Type K, Immersion, Tapered, 6" | 재고 | - | |
973939000Oscilloscope Probes | Altech Corporation | Test Probes MW MSEB | 재고 | - | |
 TCP0020Oscilloscope Probes | Tektronix | Test Probes Probe, AC/DC Current; 20 Amp; 50 MHz BW; TekVPI Interface; Certificate of Traceable Calibration Standard | 6 | - | |
 N7026AOscilloscope Probes | Keysight | Test Probes AC/DC high sensitivity current probe, 150MHz | 재고 | - | |
 XR-PB6-SMPM-01Oscilloscope Probes | Quantic X-Microwave | Test Probes Probe, SMPM on 0204 Board [PCB: 772]Full DetentAmphenolRF: 925-143J-51P | 10 | - | |
 IS9K603MTC06Oscilloscope Probes | Advanced Energy | Test Probes Temperature Probe, Intrinsic Safe, Type K, Immersion, Non-Tapered, 6" | 재고 | - | |
 PR100AOscilloscope Probes | B&K Precision | Test Probes 250 MHZ X 100 PROBE | 21 | - | |
 SPP3Oscilloscope Probes | Desco | Test Probes ESD Systems - Monitor, Ground Gard 5.5 with Buzzer & Switch, Ground | 재고 | - | |
 N4822AOscilloscope Probes | Keysight | Test Probes Socketed tip for application fixtures | 재고 | - | |
11015606-00Oscilloscope Probes | TE Connectivity Measurement Specialties | Test Probes GENERAL PURPOSEPROBE | 재고 | - | |
 DP0021A-008Oscilloscope Probes | Keysight | Test Probes Micrograbber accessory kit (set of 4) | 재고 | - | |
 10072AOscilloscope Probes | Keysight | Test Probes SMT clip kit for 10070 Probe Family | 재고 | - | |
 TICPSMAOscilloscope Probes | Tektronix | Test Probes SMA tip adapter | 재고 | - | |
 P3010Oscilloscope Probes | Tektronix | Test Probes Probe,Passive; 100MHz, 10X, with Readout, for TDS3000 Series | 재고 | - | |
 DP0041AOscilloscope Probes | Keysight | Test Probes Value accessory kit for DP003XA probes | 재고 | - | |
 I17XX-FLEX1500/18Oscilloscope Probes | Fluke Electronics | Test Probes 18 inch AC current flexible measurement clamp for use with Fluke power quality meters | 재고 | - | |
 N7040AOscilloscope Probes | Keysight | Test Probes Rogowski AC current probe, 23 MHz, 3000 A | 21 | - | |
 N2873AOscilloscope Probes | Keysight | Test Probes Passive Probe -10:1 500MHz | 23 | - |
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